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Author/Affiliation: Yuri Afanasyevich StepchenkovOpen AccessArticle
13 Pages, 1,150 KB 
Improvement of the Natural Self-Timed Circuit Tolerance to Short-Term Soft Errors
Abstract:
The paper discusses the features of the implementation and functioning of digital self-timed circuits. They have a naturally high tolerance to short-term single soft errors caused by various factors, such as nuclear particles, radiation, and others. Combinational self-timed circuits using dual-rail coding of signals are naturally immune to 91% of typical soft errors classified in…
Read More(This article belongs to the SP8 (Special Issue on Multidisciplinary Sciences and Engineering 2019-20) & Section Electronic Engineering (EEE))