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Author/Affiliation: Krishnanunni MenonAdvanced Physical Failure Analysis Techniques for Rescuing Damaged Samples with Cracks, Scratches, or Unevenness in Delayering
by Yanlin Pan, Pik Kee Tan, Siong Luong Ting, Chang Qing Chen, Hao Tan, Naiyun Xu, Krishnanunni Menon, Hnin Hnin Win Thoungh Ma and Kyaw Htin
Advances in Science, Technology and Engineering Systems Journal,
Volume 6,
Issue 4,
Page # 52–61,
2021;
DOI: 10.25046/aj060407
Abstract:
This paper is an extended version of work published in IPFA 2020. In the previous paper, advanced physical failure analysis (PFA) techniques for rescuing damaged samples with cracks, scratches, or unevenness in delayering are introduced. In the present work, the techniques will be further exploited and summarized for the potential applications in general devices. The…
Read More(This article belongs to the SP11 (Special Issue on Innovation in Computing, Engineering Science & Technology 2021) & Section Multidisciplinary Materials Science (MMU))
