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Author/Affiliation: Mohd Ikhwan Hadi YaacobOpen AccessArticle
4 Pages, 618 KB 
LabVIEW-based data acquisition system for Diode I-V Characterization
Abstract:
This work describes computerized data acquisition system for current-voltage (I-V) characteristics of diodes. The proposed system consist of a personal computer pre-installed with LabVIEW, two units of power supply, an interface board, current and voltage sensors. Two devices under test (DUTs) are selected namely 1N4007 silicon and 1N34 germanium diodes. The current flow through the…
Read More(This article belongs to the SP4 (Special issue on Advancement in Engineering Technology 2017-18) & Section Electronic Engineering (EEE))