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Keyword: ATPG (Automatic Test Pattern Generator)Open AccessArticle
7 Pages, 1,046 KB 
Design and Implementation of DFT Technique to Verify LBIST at RTL Level
Abstract:
According to IEC 61805 and ISO 26262 standards requirement inclusion of LBIST (Logic Built in Self-Test) became mandatory to achieve safety critical application such as automotive field. In such systems, once device is switched ON LBIST (Logic Built in Self-Test) is activated and testing of digital logic is performed. After safety subsystem says that the…
Read More(This article belongs to the Special Issue on Multidisciplinary Innovation in Engineering Science & Technology 2020 & Section Electronic Engineering (EEE))