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Keyword: Concurrent TestingOpen AccessArticle
10 Pages, 1,543 KB 
Design and Implementation of Quad-Site Testing on FPGA Platform
Abstract:
As manufacturing efficiency has become a main focus of today’s business, it is very critical to surge the throughput by developing different test strategies. With throughput, testing cost also has been recognized as the major challenge in the future of leading semiconductors. Reducing test time is a significant effort to maximize throughput as the complexity…
Read More(This article belongs to the SP9 (Special Issue on Multidisciplinary Innovation in Engineering Science & Technology 2020) & Section Electronic Engineering (EEE))