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Author/Affiliation: Kher Hui NgOpen AccessArticle
11 Pages, 1,234 KB 
EEG Feature Extraction based on Fast Fourier Transform and Wavelet Analysis for Classification of Mental Stress Levels using Machine Learning
Abstract:
Mental stress assessment remains riddled with biases caused by subjective reports and individual differences across societal backgrounds. To objectively determine the presence or absence of mental stress, there is a need to move away from the traditional subjective methods of self-report questionnaires and interviews. Previously, it has been evidence that EEG Oscillations can discriminate mental…
Read More(This article belongs to the SP15 (Special Issue on Innovation in Computing, Engineering Science & Technology 2023) & Section Biomedical Engineering (EBI))